Connector Reliability Evaluation – High Frequency Characteristic Tests –

High-frequency characteristics are also part of the scope of reliability laboratories, as they are part of the reliability that supports signal quality. We support the development of products compatible with the latest high-speed transmission while working closely with related departments, such as coordinating the results of CAE carried out by the technology department. The main equipment we have is as follows.

Digital sampling oscilloscope

Characteristic impedance measurement by TDR (Time Domein Reflectometly) and TDT (Time Domein Transmissometry) methods. Differential transmission with LVDS signal format from input 2ch and output 2ch, with single-ended signal transmission. Supports eye pattern confirmation test using an external pulse generator. Supports signal integrity simulation by I Connect.

Vector network analyzer

Measures the frequency characteristics of the high-frequency signal that passes through and reflects the measurement target (DUT) as an S parameter Supports differential transmission in LVDS signal format from 2 ports each for input and output, 4 ports in total. Connector area can be extracted by De-embedding using PLTS (Physical Layer Test System) Can generate touchstone data for external simulation.

High-Performance Serial BERT

Generation of pulse patterns (arbitrary, PRBS7, etc.) in NRZ format (normal, reversible). Output characteristics can be changed according to the level within the range.

Near-field EMC noise scanner / Signal analyzer

The probe is automatically scanned according to the measurement sample, Measure the frequency and intensity of the generated noise, Possible to visualize the source of near-field EMI by superimposing and mapping the position information captured by camera.

Electromagnetic field measurement

10103 series (shielded) measurement

10103 series (unshielded) measurement